丝印：AHCT125Q；Package：SOIC；SN74AHCT125-Q1 Automotive Quadruple Bus Buffer Gates With 3-State Outputs

1 Features • Inputs are TTL-voltage compatible • Latch-up performance exceeds 250 mA per JESD 17 • Functional Safety Capable – Documentation available to aid safety system design 2 Applications • Enable or disable a digital signal • Controlling an indicator LED • Debounce a switch • E

文件：1.51325 Mbytes 页数：25 Pages

TI

德州仪器

丝印：AHCT125Q；Package：SOIC；SN74AHCT125-Q1 Automotive Quadruple Bus Buffer Gates With 3-State Outputs

1 Features • Inputs are TTL-voltage compatible • Latch-up performance exceeds 250 mA per JESD 17 • Functional Safety Capable – Documentation available to aid safety system design 2 Applications • Enable or disable a digital signal • Controlling an indicator LED • Debounce a switch • E

文件：1.51325 Mbytes 页数：25 Pages

TI

德州仪器

丝印：AHCT125QEP；Package：SOIC；QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† ESD Protection Exceeds 2000 V Per MIL-STD-883, Metho

文件：528.04 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT125QEP；Package：SOIC；QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† ESD Protection Exceeds 2000 V Per MIL-STD-883, Metho

文件：528.04 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT125QEP；Package：SOIC；QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† ESD Protection Exceeds 2000 V Per MIL-STD-883, Metho

文件：528.04 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT125QEP；Package：SOIC；QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† ESD Protection Exceeds 2000 V Per MIL-STD-883, Metho

文件：528.04 Kbytes 页数：16 Pages

TI

德州仪器