丝印：AHC00；Package：WQFN；SNx4AHC00 Quadruple 2-Input Positive-NAND Gates

1 Features • Operating Range 2-V to 5.5-V • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The ’AHC00 devices perform the Boolean function Y = A • B or Y = A + B in positive logic.

文件：2.73979 Mbytes 页数：37 Pages

TI

德州仪器

丝印：AHC00；Package：SOIC；SNx4AHC00 Quadruple 2-Input Positive-NAND Gates

1 Features • Operating Range 2-V to 5.5-V • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The ’AHC00 devices perform the Boolean function Y = A • B or Y = A + B in positive logic.

文件：2.73979 Mbytes 页数：37 Pages

TI

德州仪器

丝印：AHC00；Package：SO；SNx4AHC00 Quadruple 2-Input Positive-NAND Gates

1 Features • Operating Range 2-V to 5.5-V • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The ’AHC00 devices perform the Boolean function Y = A • B or Y = A + B in positive logic.

文件：2.73979 Mbytes 页数：37 Pages

TI

德州仪器

丝印：AHC00MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree EPIC (Enhanced-Performance Implanted CMOS) Process O

文件：518.559 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AHC00MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree EPIC (Enhanced-Performance Implanted CMOS) Process O

文件：518.559 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AHC00Q；Package：SOIC；SN74AHC00-Q1 Automotive Quadruple 2-Input Positive-NAND Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V V CC • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The SN74AHC00 device performs the Boolean function Y + A • B or Y = A + B in positive logic.

文件：1.48223 Mbytes 页数：22 Pages

TI

德州仪器

丝印：AHC00Q；Package：SOIC；SN74AHC00-Q1 Automotive Quadruple 2-Input Positive-NAND Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V V CC • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The SN74AHC00 device performs the Boolean function Y + A • B or Y = A + B in positive logic.

文件：1.48223 Mbytes 页数：22 Pages

TI

德州仪器

丝印：AHC00Q；Package：WQFN；SN74AHC00-Q1 Automotive Quadruple 2-Input Positive-NAND Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V V CC • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The SN74AHC00 device performs the Boolean function Y + A • B or Y = A + B in positive logic.

文件：1.48223 Mbytes 页数：22 Pages

TI

德州仪器

丝印：AHC00MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree EPIC (Enhanced-Performance Implanted CMOS) Process O

文件：518.559 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AHC00MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree EPIC (Enhanced-Performance Implanted CMOS) Process O

文件：518.559 Kbytes 页数：15 Pages

TI

德州仪器