丝印：ADC3664SEP；Package：WQFN；ADC3664-SEP ADC3664-EP 14-Bit, 125MSPS, Low Noise, Low Power Dual Channel ADC

1 Features • Radiation tolerant (-SEP only): – Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg – Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg – Total ionizing dose (TID): 30krad(Si) • Enhanced product (-EP and -SEP): – Meets ASTM E595 outgas

文件：3.90462 Mbytes 页数：71 Pages

TI

德州仪器

ADC3664-SEP ADC3664-EP 14-Bit, 125MSPS, Low Noise, Low Power Dual Channel ADC

1 Features • Radiation tolerant (-SEP only): – Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg – Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg – Total ionizing dose (TID): 30krad(Si) • Enhanced product (-EP and -SEP): – Meets ASTM E595 outgas

文件：3.90462 Mbytes 页数：71 Pages

TI

德州仪器

ADC3664-SP Radiation-Hardness-Assured 14-Bit, Dual Channel, 1 to 125MSPS, Low Latency, Low Noise, Ultra-low Power, Analog-to-Digital Converter (ADC)

1 Features • Screening and radiation performance – QMLV screening and reliability assurance – Total ionizing dose (TID): 300krad (Si) – Single event latch-up (SEL): 75MeV-cm2/mg • Ambient temperature range: -55°C to 105°C • Dual Channel ADC • 14-bit 125MSPS • Noise floor: -156.9dBFS/Hz •

文件：2.32553 Mbytes 页数：66 Pages

TI

德州仪器

ADC3664-SEP ADC3664-EP 14-Bit, 125MSPS, Low Noise, Low Power Dual Channel ADC

1 Features • Radiation tolerant (-SEP only): – Single-event latch-up (SEL) immune up to LET = 43 MeV-cm2/mg – Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm2/mg – Total ionizing dose (TID): 30krad(Si) • Enhanced product (-EP and -SEP): – Meets ASTM E595 outgas

文件：3.90462 Mbytes 页数：71 Pages

TI

德州仪器