丝印：ACT163M；Package：SOIC；4-BIT SYNCHRONOUS BINARY COUNTERS

Inputs Are TTL-Voltage Compatible Internal Look-Ahead for Fast Counting Carry Output for n-Bit Cascading Synchronous Counting Synchronously Programmable description/ordering information The ’ACT163 devices are 4-bit binary counters. These synchronous, presettable counters feature an inte

文件：462.2 Kbytes 页数：18 Pages

TI

德州仪器

丝印：ACT163M；Package：SOIC；4-BIT SYNCHRONOUS BINARY COUNTERS

Inputs Are TTL-Voltage Compatible Internal Look-Ahead for Fast Counting Carry Output for n-Bit Cascading Synchronous Counting Synchronously Programmable description/ordering information The ’ACT163 devices are 4-bit binary counters. These synchronous, presettable counters feature an inte

文件：462.2 Kbytes 页数：18 Pages

TI

德州仪器

丝印：ACT163M；Package：SOIC；4-BIT SYNCHRONOUS BINARY COUNTERS

Inputs Are TTL-Voltage Compatible Internal Look-Ahead for Fast Counting Carry Output for n-Bit Cascading Synchronous Counting Synchronously Programmable description/ordering information The ’ACT163 devices are 4-bit binary counters. These synchronous, presettable counters feature an inte

文件：462.2 Kbytes 页数：18 Pages

TI

德州仪器

丝印：ACT16373QEP；Package：SSOP；16-BIT D-TYPE TRANSPARENT LATCH WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：535.6 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16373QEP；Package：SSOP；16-BIT D-TYPE TRANSPARENT LATCH WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：535.6 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16374QEP；Package：SSOP；16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16374QEP；Package：SSOP；16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16373QEP；Package：SSOP；16-BIT D-TYPE TRANSPARENT LATCH WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：535.6 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16374QEP；Package：SSOP；16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16373QEP；Package：SSOP；16-BIT D-TYPE TRANSPARENT LATCH WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：535.6 Kbytes 页数：10 Pages

TI

德州仪器