SN74ABTH162245DL

Marking：ABTH162245；Package：SSOP；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

MembersoftheTexasInstruments WidebusEFamily A-PortOutputsHaveEquivalent25-W SeriesResistors,SoNoExternalResistors AreRequired State-of-the-ArtEPIC-IIBEBiCMOSDesign SignificantlyReducesPowerDissipation TypicalVOLP(OutputGroundBounce)

SN74ABTH16245DGGR

Marking：ABTH16245；Package：TSSOP；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

MembersoftheTexasInstruments WidebusEFamily State-of-the-ArtEPIC-IIBEBiCMOSDesign SignificantlyReducesPowerDissipation TypicalVOLP(OutputGroundBounce)

SN74ABTH16245DL

Marking：ABTH16245；Package：SSOP；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

MembersoftheTexasInstruments WidebusEFamily State-of-the-ArtEPIC-IIBEBiCMOSDesign SignificantlyReducesPowerDissipation TypicalVOLP(OutputGroundBounce)

SN74ABTH16245DLR

Marking：ABTH16245；Package：SSOP；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

MembersoftheTexasInstruments WidebusEFamily State-of-the-ArtEPIC-IIBEBiCMOSDesign SignificantlyReducesPowerDissipation TypicalVOLP(OutputGroundBounce)

SN74ABTH182502APM

Marking：ABTH182502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPort andBoundary-ScanArchitecture UBTE(UniversalBusTransceiver) CombinesD-TypeLatchesandD-Typ

SN74ABTH182646APM

Marking：ABTH182646A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMultiplex

SN74ABTH182652APM

Marking：ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts MembersoftheTexasInstruments. Widebus™Family CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMult

SN74ABTH18502APM

Marking：ABTH18502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPort andBoundary-ScanArchitecture UBTE(UniversalBusTransceiver) CombinesD-TypeLatchesandD-Typ

SN74ABTH18502APMR

Marking：ABTH18502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPort andBoundary-ScanArchitecture UBTE(UniversalBusTransceiver) CombinesD-TypeLatchesandD-Typ

SN74ABTH18646APM

Marking：ABTH18646A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMultiplex