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5962R2320101VXC

丝印:5962R2320101VXC;Package:CFP;TPS7H3014-SP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si) – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg – Single-event f

文件:7.67755 Mbytes 页数:60 Pages

TI

德州仪器

5962R2320101VXC

丝印:5962R2320101VXC;Package:CFP;TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML's and 50 krad(Si) for the SEP – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tran

文件:7.67021 Mbytes 页数:64 Pages

TI

德州仪器

5962R2320101VXC

丝印:5962R2320101VXC;Package:CFP;TPS7H3014-SP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si) – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg – Single-event f

文件:7.67755 Mbytes 页数:60 Pages

TI

德州仪器

5962R2320101VXC

丝印:5962R2320101VXC;Package:CFP;TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML's and 50 krad(Si) for the SEP – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tran

文件:7.67021 Mbytes 页数:64 Pages

TI

德州仪器

5962R2320101VXC.Z

TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML's and 50 krad(Si) for the SEP – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tran

文件:7.67021 Mbytes 页数:64 Pages

TI

德州仪器

供应商型号品牌批号封装库存备注价格
TI/德州仪器
25+
原厂封装
10280
原厂授权代理,专注军工、汽车、医疗、工业、新能源!
询价
TI/德州仪器
25+
原厂封装
9999
询价
TI/德州仪器
25+
原厂封装
10280
询价
AD
05+
100
原装正品
询价
ADI
24+
ROUND HEADER/METAL CAN
3660
十年信誉,只做全新原装正品现货,以优势说话 !!
询价
ADI/亚德诺
24+
CAN8
12000
原装正品 有挂就有货
询价
ADI/亚德诺
2511
原封装
66900
电子元器件采购降本 30%!盈慧通原厂直采,砍掉中间差价
询价
ADI
24+
N/A
6300
“芯达集团”专注军工级宇航级元器件欢迎来电咨询0755
询价
ADI/亚德诺
23+
CAN8
5000
原厂授权代理,海外优势订货渠道。可提供大量库存,详
询价
UTMC
2023+
5850
进口原装现货
询价
更多5962R2320101VXC供应商 更新时间2025-9-21 15:16:00