丝印：S9541SEP；Package：TSSOP；SN54SC8T9541-SEP Radiation Tolerant, Octal Buffers/Drivers with 3-State Outputs and Schmitt-Trigger Inputs

1 Features • Vendor item drawing available, VID V62/25633-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

文件：1.15365 Mbytes 页数：26 Pages

TI

德州仪器

SN54SC8T9541-SEP Radiation Tolerant, Octal Buffers/Drivers with 3-State Outputs and Schmitt-Trigger Inputs

1 Features • Vendor item drawing available, VID V62/25633-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event

文件：1.19241 Mbytes 页数：26 Pages

TI

德州仪器

SN54SC8T9541-SEP Radiation Tolerant, Octal Buffers/Drivers with 3-State Outputs and Schmitt-Trigger Inputs

1 Features • Vendor item drawing available, VID V62/25633-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event

文件：1.19241 Mbytes 页数：26 Pages

TI

德州仪器

SN54SC8T9541-SEP Radiation Tolerant, Octal Buffers/Drivers with 3-State Outputs and Schmitt-Trigger Inputs

1 Features • Vendor item drawing available, VID V62/25633-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

文件：1.15365 Mbytes 页数：26 Pages

TI

德州仪器

SN54SC8T9541-SEP Radiation Tolerant, Octal Buffers/Drivers with 3-State Outputs and Schmitt-Trigger Inputs

1 Features • Vendor item drawing available, VID V62/25633-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event

文件：1.19241 Mbytes 页数：26 Pages

TI

德州仪器