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UCC21550-Q1_V01中文资料德州仪器数据手册PDF规格书
UCC21550-Q1_V01规格书详情
1 Features
• Universal: dual low-side, dual high-side or
halfbridge driver
• AEC-Q100 qualified with the following results
– Device temperature grade 1
• Junction temperature range –40 to +150°C
• Up to 4A peak source and 6A peak sink output
• Common-mode transient immunity (CMTI) greater
than 125V/ns
• Up to 25V VDD output drive supply
– 5V, 8V, 12V VDD UVLO options
• Switching parameters:
– 33ns typical propagation delay
– 5ns maximum pulse-width distortion
– 10μs maximum VDD power-up delay
• UVLO protection for all power supplies
• Fast disable for power sequencing
2 Applications
• On-board battery chargers
• High-voltage DC-DC converters
• Automotive HVAC, body electronics
3 Description
The UCC21550-Q1 is an isolated dual channel gate
driver family with programmable dead time and wide
temperature range. It is designed with 4A peak-source
and 6A peak-sink current to drive power MOSFET,
SiC, GaN, and IGBT transistors.
The UCC21550-Q1 can be configured as two low-side
drivers, two high-side drivers, or a half-bridge driver.
The input side is isolated from the two output drivers
by a 5kVRMS isolation barrier, with a minimum of
125V/ns common-mode transient immunity (CMTI).
Protection features include: resistor programmable
dead time, disable feature to shut down both outputs
simultaneously, and integrated de-glitch filter that
rejects input transients shorter than 5ns. All supplies
have UVLO protection.
With all these advanced features, the UCC21550-
Q1 device enables high efficiency, high power
density, and robustness in a wide variety of power
applications.


