TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr

文件：3.67718 Mbytes 页数：76 Pages

TI

德州仪器

TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr

文件：2.70879 Mbytes 页数：66 Pages

TI

德州仪器

TPS7H401x-SP and TPS7H401x-SEP 4.5V to 14V Input, 3A and 6A, Radiation Hardened Synchronous Buck Converter

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr

文件：2.71276 Mbytes 页数：53 Pages

TI

德州仪器

TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr

文件：3.55172 Mbytes 页数：79 Pages

TI

德州仪器

TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr

文件：3.67718 Mbytes 页数：76 Pages

TI

德州仪器

耐辐射 QMLV、4.5V 至 14V 输入、12A 同步降压转换器

The TPS7H4011 is a 14V, 12A synchronous buck converter optimized for use in a space environment. The peak current mode converter obtains high efficiency with good transient performance and reduced component count. \n\nThe wide voltage range of the TPS7H4011 enables it to be used as a point of load r Total ionizing dose (TID) characterized \n \nRadiation hardness assurance (RHA) availability of up to 100krad(Si)\n \n\n \nSingle-Event Effects (SEE) characterized \n \nSingle-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (L;

TI

德州仪器