TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML's and 50 krad(Si) for the SEP – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tran

文件：7.70221 Mbytes 页数：65 Pages

TI

德州仪器

抗辐射 14V 四通道电源序列发生器

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active hi Radiation performance: \n \nRadiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP\n \nSingle-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 M;

TI

德州仪器

TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML's and 50 krad(Si) for the SEP – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tran

文件：7.70221 Mbytes 页数：65 Pages

TI

德州仪器

TPS7H3014-SP Radiation-Hardened, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si) – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg – Single-event f

文件：7.67755 Mbytes 页数：60 Pages

TI

德州仪器

TPS7H3014-SP Radiation-Hardness-Assured, 14V, 4-Channel Sequencer

1 Features • Radiation performance: – Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si) – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg – Single-event f

文件：7.57478 Mbytes 页数：53 Pages

TI

德州仪器