TPS79730-EP数据手册TI中文资料规格书

描述 Description

The TPS797xx family of low-dropout (LDO) voltage regulators offers the benefits of low-dropout voltage and ultralow-power operation. The device is stable with any capacitor (> 0.47 µF). Therefore, implementations of this device require little board space due to the miniaturized packaging and potentially small output capacitor. In addition, the family includes an integrated open drain active-high power good (PG) output. Intended for use in microcontroller based, battery-powered applications, the TPS797xx family's low dropout and ultralow-powered operation results in a significant increase in system battery operating life. The small packaging minimizes consumption of board space. The device is enabled when the applied voltage exceeds the minimum input voltage. The usual PNP pass transistor has been replaced by a PMOS pass element. Because the PMOS pass element behaves as a low-value resistor, the dropout voltage is low, 125 mV (typ) at 10 mA of load current and is directly proportional to the load current. The quiescent current is ultralow (1.2 µA typ) and is stable over the entire range of output load current (0 mA to 10 mA). When properly configured with a pullup resistor, the PG output can be used to implement a power-on reset or low battery indicator. The TPS797xx is offered in 1.8 V, 3 V, and 3.3 V fixed options.

特性 Features

• Controlled Baseline
• One Assembly Site
• One Test Site
• One Fabrication Site

• Extended Temperature Performance of -55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• 10 mA Low-Dropout Regulator
• Ultralow 1.2 mA Quiescent Current at 10 mA
• 5-Pin SC70/SOT-323 (DCK) Package
• Integrated Power Good Output
• Stable With Any Capacitor (> 0.47 µF)
• Dropout Voltage Typically 105 mV at 10 mA (TPS79733)
• Overcurrent Limitation
• APPLICATIONS
• Battery-Powered Microcontrollers and Microprocessors


Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.