TPS793285-EP数据手册TI中文资料规格书

描述 Description

The TPS793xx family of low-dropout (LDO) low-power linear voltage regulators features high power-supply rejection ratio (PSRR), ultralow noise, fast start-up, and excellent line and load transient responses in a small-outline SOT23 package. Each device in the family is stable, with a small 2.2-µF ceramic capacitor on the output. The TPS793xx family uses an advanced, proprietary, BiCMOS fabrication process to yield extremely low dropout voltages (e.g., 112 mV at 200 mA, TPS79330). Each device achieves fast start-up times (approximately 50 µs with a 0.001-µF bypass capacitor), while consuming very low quiescent current (170 µA typical). Moreover, when the device is placed in standby mode, the supply current is reduced to less than 1 µA. The TPS79328 exhibits approximately 32 µVRMS of output voltage noise with a 0.1-µF bypass capacitor. Applications with analog components that are noise sensitive, such as portable RF electronics, benefit from the high PSRR and low-noise features, as well as the fast response time.

特性 Features

• Controlled Baseline
• One Assembly/Test Site, One Fabrication Site

• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• 200-mA Low-Dropout Regulator With EN
• Available in 1.8 V, 2.5 V, 2.8 V, 2.85 V, 3 V, 3.3 V, 4.75 V, and Adjustable
• High PSRR (70 dB at 10 kHz)
• Ultralow Noise (32 µV)
• Fast Start-Up Time (50 µs)
• Stable With a 2.2-µF Ceramic Capacitor
• Excellent Load/Line Transient
• Very Low Dropout Voltage (112 mV at Full Load, TPS79330)
• 5-Pin SOT23 (DBV) Package
• APPLICATIONS
• VCOs
• RF
• Bluetooth™, Wireless LAN


Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over specified temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Bluetooth is a trademark of Bluetooth SIG, Inc.