TPS76718-EP中文资料增强型产品快速瞬态响应 1A 低压降稳压器数据手册TI规格书

描述 Description

This device is designed to have a fast transient response and be stable with 10-µF low ESR capacitors. This combination provides high performance at a reasonable cost.
Because the PMOS device behaves as a low-value resistor, the dropout voltage is very low (typically 230 mV at an output current of 1 A for the TPS76750) and is directly proportional to the output current. Additionally, since the PMOS pass element is a voltage-driven device, the quiescent current is very low and independent of output loading (typically 85 µA over the full range of output current, 0 mA to 1 A). These two key specifications yield a significant improvement in operating life for battery-powered systems. This LDO family also features a sleep mode; applying a TTL high signal to EN\\ (enable) shuts down the regulator, reducing the quiescent current to 1 µA at TJ = 25°C.
The RESET\\ output of the TPS767xx initiates a reset in microcomputer and microprocessor systems in the event of an undervoltage condition. An internal comparator in the TPS767xx monitors the output voltage of the regulator to detect an undervoltage condition on the regulated output voltage.
The TPS767xx is offered in 1.5-V, 1.8-V, 2.5-V, 2.7-V, 2.8-V, 3.0-V, 3.3-V, and 5.0-V fixed-voltage versions and in an adjustable version (programmable over the range of 1.5 V to 5.5 V). Output voltage tolerance is specified as a maximum of 2% over line, load, and temperature ranges. The TPS767xx family is available in a 20-pin PWP package.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of –40°C to 125°C
• Enhanced Product Change Notification
• 1 A Low-Dropout Voltage Regulator
• Dropout Voltage Down to 230 mV at 1 A (TPS76750)
• Fast Transient Response
• Open Drain Power-On Reset With 200-ms Delay (See TPS768xx for PG Option)
• Thermal Shutdown Protection
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. PowerPAD is a trademark of Texas Instruments.