TPS371K-Q1数据手册TI中文资料规格书

描述 Description

TPS371K-Q1 is an automotive supervisor for voltage monitoring with an integrated buffer for 400V and 800V DC-link voltage measurements. The TPS371K-Q1 eliminates large resistor ladders with the integrated high voltage ladder. This device’s SENSE pin can be directly connected to 400V or 800V automotive battery systems and DC-Link for continuous monitoring of overvoltage (OV), undervoltage (UV), and low undervoltage (LUV) conditions. The TPS371K-Q1 offers CTS for programmable glitch rejection for noisy environments.

The TPS371K-Q1 has a integrated high-speed buffer VSENSE for supply voltage measurements. The buffer has a low output impedance which can directly drive ADC inputs. VSENSE is a scaled down voltage of the SENSE pin input.

The combination of voltage supervisor and integrated buffer allows for the smallest signal chain size for direct monitoring of 400V and 800V systems. This combination also allows for redundant digital and analog always on voltage fault monitoring.

The TPS371K-Q1 is available in a 12.8mm × 7.4mm SOIC 15-pin package. TPS371K-Q1 operates over -40°C to +125°C TA.

特性 Features

AEC-Q100 qualified for automotive applications

Device temperature grade 1: –40°C to +125°C



Functional Safety-Compliant Targeted (Preview)

Development targeted for functional safety applications

Documentation to aid ISO 26262 system design



Overvoltage and undervoltage fault monitor for 400V & 800V BMS and DC-Link

1% overvoltage and undervoltage outputs

Fast detection time (<5µs) to help minimize system fault tolerant time interval

30V to 60V Low UV output



Device flexibility to meet design requirements

User selectable adjustable overvoltage and undervoltage thresholds

User programmable capacitor-based glitch rejection and deassertion delay



Integrated buffer for ADC monitoring

High accuracy 0.35% (maximum) scaled down voltage of sense pin

VSENSE pin can directly drive high-speed ADC inputs



Designed for safety applications (Preview)

Output latching feature to help bring system to safe state

Built-In Self-Test to monitor device functionality and enhance system protection