12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

Qualified for Automotive Applications 12-Bit Resolution A/D Converter 10-μs Conversion Time Over Operating Temperature 11 Analog Input Channels Three Built-In Self-Test Modes Inherent Sample-and-Hold Function Linearity Error . . . ±1 LSB Max On-Chip System Clock End-of-Conversion Output

文件：558.63 Kbytes 页数：27 Pages

TI

德州仪器

12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

文件：700.96 Kbytes 页数：28 Pages

TI

德州仪器

丝印：TLC2543Q1；Package：SSOP；12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

Qualified for Automotive Applications 12-Bit Resolution A/D Converter 10-μs Conversion Time Over Operating Temperature 11 Analog Input Channels Three Built-In Self-Test Modes Inherent Sample-and-Hold Function Linearity Error . . . ±1 LSB Max On-Chip System Clock End-of-Conversion Output

文件：558.63 Kbytes 页数：27 Pages

TI

德州仪器

丝印：TLC2543Q1；Package：SSOP；12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

Qualified for Automotive Applications 12-Bit Resolution A/D Converter 10-μs Conversion Time Over Operating Temperature 11 Analog Input Channels Three Built-In Self-Test Modes Inherent Sample-and-Hold Function Linearity Error . . . ±1 LSB Max On-Chip System Clock End-of-Conversion Output

文件：558.63 Kbytes 页数：27 Pages

TI

德州仪器

丝印：TLC2543Q1；Package：SSOP；12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

Qualified for Automotive Applications 12-Bit Resolution A/D Converter 10-μs Conversion Time Over Operating Temperature 11 Analog Input Channels Three Built-In Self-Test Modes Inherent Sample-and-Hold Function Linearity Error . . . ±1 LSB Max On-Chip System Clock End-of-Conversion Output

文件：558.63 Kbytes 页数：27 Pages

TI

德州仪器

丝印：TLC2543Q1；Package：SSOP；12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS

Qualified for Automotive Applications 12-Bit Resolution A/D Converter 10-μs Conversion Time Over Operating Temperature 11 Analog Input Channels Three Built-In Self-Test Modes Inherent Sample-and-Hold Function Linearity Error . . . ±1 LSB Max On-Chip System Clock End-of-Conversion Output

文件：558.63 Kbytes 页数：27 Pages

TI

德州仪器