THS1206-EP中文资料增强型产品 12 位、6MSPS ADC，四通道（可配置）、DSP/uP IF、集成16x Fifo数据手册TI规格书

描述 Description

The THS1206 is a CMOS, low-power, 12-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs, which are sampled simultaneously. These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.

An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST)\\. The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS1206. The internal clock oscillator is switched off in continuous conversion mode.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of –55°C to 125°C
• Enhanced Product Change Notification
• High-Speed 6 MSPS ADC
• Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
• Integral Nonlinearity Error: ±1.8 LSB
• Auto-Scan Mode for 2, 3, or 4 Inputs
• Low Power: 216 mW Max
• Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
• Parallel µC/DSP Interface
• Available in TSSOP Package
• Radar Applications
• Control Applications
• Selected Military Applications

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.