TC4429EOA集成电路（IC）的栅极驱动器规格书PDF中文资料

TC4429EOA属于集成电路（IC）的栅极驱动器。由美国微芯科技公司制造生产的TC4429EOA栅极驱动器栅极驱动器电源管理集成电路 (PMIC) 可用于提供隔离、放大、参考位移、自举或其他必要功能，这些功能可将来自电源转换应用中控制设备的信号连接到电源被控制通过的半导体设备（通常为 FET 或 IGBT）。任何特定设备提供的确切功能各不相同，但与它适合驱动的半导体配置相关。

FEATURES

Latch-Up Protected ............ Will Withstand >1.5A

Reverse Output Current

Logic Input Will Withstand Negative Swing Up

to 5V

ESD Protected ..................................................... 4kV

Matched Rise and Fall Times ...................... 25nsec

High Peak Output Current ......................... 6A Peak

Wide Operating Range .......................... 4.5V to 18V

High Capacitive Load Drive ......................10,000pF

Short Delay Time ................................. 55nsec Typ.

Logic High Input, Any Voltage ............. 2.4V to VDD

Low Supply Current With Logic 1 Input ... 450μA

Low Output Impedance .................................... 2.5Ω

Output Voltage Swing to Within 25mV of Ground

or VDD

APPLICATIONS

Switch-Mode Power Supplies

Motor Controls

Pulse Transformer Driver

Class D Switching Amplifiers

GENERAL DESCRIPTION

The TC4420/4429 are 6A (peak), single output MOSFET

drivers. The TC4429 is an inverting driver (pin-compatible

with the TC429), while the TC4420 is a non-inverting driver.

These drivers are fabricated in CMOS for lower power, more

efficient operation versus bipolar drivers.

Both devices have TTL-compatible inputs, which can be

driven as high as VDD + 0.3V or as low as – 5V without upset

or damage to the device. This eliminates the need for

external level shifting circuitry and its associated cost and

size. The output swing is rail-to-rail ensuring better drive

voltage margin, especially during power up/power down

sequencing. Propagational delay time is only 55nsec (typ.)

and the output rise and fall times are only 25nsec (typ.) into

2500pF across the usable power supply range.

Unlike other drivers, the TC4420/4429 are virtually

latch-up proof. They replace three or more discrete components

saving PCB area, parts and improving overall system

reliability.