SPC5607BAVLQ4R中文资料恩XP数据手册PDF规格书

Features

• Single issue, 32-bit CPU core complex (e200z0h)

— Compliant with the Power Architecture® technology

embedded category

— Enhanced instruction set allowing variable length

encoding (VLE) for code size footprint reduction.

With the optional encoding of mixed 16-bit and

32-bit instructions, it is possible to achieve

significant code size footprint reduction.

• Up to 1.5 MB on-chip code flash memory supported with

the flash memory controller

• 64 (4 × 16) KB on-chip data flash memory with ECC

• Up to 96 KB on-chip SRAM

• Memory protection unit (MPU) with 8 region descriptors

and 32-byte region granularity on certain family members

(Refer to Table 1 for details.)

• Interrupt controller (INTC) capable of handling 204

selectable-priority interrupt sources

• Frequency modulated phase-locked loop (FMPLL)

• Crossbar switch architecture for concurrent access to

peripherals, Flash, or RAM from multiple bus masters

• 16-channel eDMA controller with multiple transfer

request sources using DMA multiplexer

• Boot assist module (BAM) supports internal Flash

programming via a serial link (CAN or SCI)

• Timer supports I/O channels providing a range of 16-bit

input capture, output compare, and pulse width

modulation functions (eMIOS)

• 2 analog-to-digital converters (ADC): one 10-bit and one

12-bit

• Cross Trigger Unit to enable synchronization of ADC

conversions with a timer event from the eMIOS or PIT

• Up to 6 serial peripheral interface (DSPI) modules

• Up to 10 serial communication interface (LINFlex)

modules

• Up to 6 enhanced full CAN (FlexCAN) modules with

configurable buffers

• 1 inter-integrated circuit (I2C) interface module

• Up to 149 configurable general purpose pins supporting

input and output operations (package dependent)

• Real-Time Counter (RTC)

• Clock source from internal 128 kHz or 16 MHz oscillator

supporting autonomous wakeup with 1 ms resolution with

maximum timeout of 2 seconds

• Optional support for RTC with clock source from external

32 kHz crystal oscillator, supporting wakeup with 1 sec

resolution and maximum timeout of 1 hour

• Up to 8 periodic interrupt timers (PIT) with 32-bit counter

resolution

• Nexus development interface (NDI) per IEEE-ISTO

5001-2003 Class Two Plus

• Device/board boundary scan testing supported per Joint

Test Action Group (JTAG) of IEEE (IEEE 1149.1)

• On-chip voltage regulator (VREG) for regulation of

input supply for all internal levels