SNJ54BCT8244AJT规格书供应商报价德州仪器-114ic电子网

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SNJ54BCT8244AJT	文件：462.37 Kbytes Page：27 Pages	丝印：5962-9172601MLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation 文件：462.37 Kbytes 页数：27 Pages	TI 德州仪器	TI
SNJ54BCT8244AJT	文件：472.15 Kbytes Page：26 Pages	SCAN TEST DEVICES WITH OCTAL BUFFERS 文件：472.15 Kbytes 页数：26 Pages	TI 德州仪器	TI
SNJ54BCT8244AJT	文件：612.97 Kbytes Page：28 Pages	SCAN TEST DEVICES WITH OCTAL BUFFERS 文件：612.97 Kbytes 页数：28 Pages	TI 德州仪器	TI
SNJ54BCT8244AJT	文件：642.79 Kbytes Page：28 Pages	SCAN TEST DEVICES WITH OCTAL BUFFERS 文件：642.79 Kbytes 页数：28 Pages	TI 德州仪器	TI
SNJ54BCT8244AJT.A	文件：462.37 Kbytes Page：27 Pages	丝印：5962-9172601MLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation 文件：462.37 Kbytes 页数：27 Pages	TI 德州仪器	TI

更多SNJ54BCT8244AJT供应商更新时间2025-10-13 14:16:00