SNJ54BCT543JT中文资料德州仪器数据手册PDF规格书

State-of-the-Art BiCMOS Design

Significantly Reduces ICCZ

3-State True Outputs

Back-to-Back Registers for Storage

ESD Protection Exceeds 2000 V

Per MIL-STD-883C, Method 3015

Package Options Include Plastic

Small-Outline Packages (DW), Ceramic

Chip Carriers (FK) and Flatpacks (W), and

Plastic and Ceramic 300-mil DIPs (JT, NT)

description

The ′BCT543 octal transceiver contains two sets

of D-type latches for temporary storage of data

flowing in either direction. Separate latch-enable

(LEAB or LEBA) and output-enable (OEAB or

OEBA) inputs are provided for each register to

permit independent control in either direction of

data flow.

The A-to-B enable (CEAB) input must be low in

order to enter data from A or to output data from

B. If CEAB is low and LEAB is low, the A-to-B

latches are transparent; a subsequent low-to-high

transition of LEAB puts the A latches in the storage

mode. With CEAB and OEAB both low, the 3-state

B outputs are active and reflect the data present

at the output of the A latches. Data flow from B to

A is similar but requires using the CEBA, LEBA,

and OEBA inputs.

The SN54BCT543 is characterized for operation

over the full military temperature range of −55°C

to 125°C. The SN74BCT543 is characterized for

operation from 0°C to 70°C.