SNJ54ACT8997FK中文资料德州仪器数据手册PDF规格书

Members of the Texas Instruments

SCOPE E Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Serial Test Bus

Allow Partitioning of System Scan Paths

Can Be Cascaded Horizontally or Vertically

Select Up to Four Secondary Scan Paths to

Be Included in a Primary Scan Path

Include 8-Bit Programmable Binary Counter

to Count or Initiate Interrupt Signals

Include 4-Bit Identification Bus for

Scan-Path Identification

Inputs Are TTL Compatible

EPIC E (Enhanced-Performance Implanted

CMOS) 1-mm Process

Package Options Include Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

(NT) and Ceramic (JT) 300-mil DIPs

description

The ’ACT8997 are members of the Texas

Instruments SCOPEE testability integratedcircuit

family. This family of components facilitates

testing of complex circuit-board assemblies.

The ’ACT8997 enhance the scan capability of TI’s

SCOPEE family by allowing augmentation of a

system’s primary scan path with secondary scan

paths (SSPs), which can be individually selected

by the ’ACT8997 for inclusion in the primary scan

path. These devices also provide buffering of test

signals to reduce the need for external logic.

By loading the proper values into the instruction

register and data registers, the user can select up

to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any

of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed

between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.

All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit

programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and

output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on

either the rising or falling edge of DCI.

The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.

The SN54ACT8997 is characterized for operation over the full military temperature range of –55°C to 125°C.

The SN74ACT8997 is characterized for operation from 0°C to 70°C.