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SN74LVTH244A-EP中文资料具有总线保持、TTL 兼容型 CMOS 输入和三态电路的增强型产品 8 通道、2.7V 至 3.6V 缓冲器数据手册TI规格书

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厂商型号

SN74LVTH244A-EP

功能描述

具有总线保持、TTL 兼容型 CMOS 输入和三态电路的增强型产品 8 通道、2.7V 至 3.6V 缓冲器

制造商

TI Texas Instruments

中文名称

德州仪器 美国德州仪器公司

数据手册

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更新时间

2025-9-24 9:06:00

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SN74LVTH244A-EP规格书详情

描述 Description

This octal buffer and line driver is designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.

The SN74LVTH244A is organized as two 4-bit line drivers with separate output-enable (OE)\\ inputs. When OE\\ is low, the device passes data from the A inputs to the Y outputs. When OE\\ is high, the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

This device is fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of –40°C to 125°C
• Enhanced Product-Change Notification
• Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
• Supports Unregulated Battery Operation Down to 2.7 V
• Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
• ESD Protection Exceeds JESD 22
• 200-V Machine Model (A115-A)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

技术参数

  • 制造商编号

    :SN74LVTH244A-EP

  • 生产厂家

    :TI

  • Supply voltage (Min) (V)

    :2.7

  • Supply voltage (Max) (V)

    :3.6

  • Number of channels (#)

    :8

  • IOL (Max) (mA)

    :32

  • ICC (Max) (uA)

    :5000

  • IOH (Max) (mA)

    :-24

  • Input type

    :TTL-Compatible CMOS

  • Output type

    :3-State

  • Features

    :Ultra high speed (tpd

  • Rating

    :HiRel Enhanced Product

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