3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：655.55 Kbytes 页数：39 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：562.71 Kbytes 页数：36 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：703.08 Kbytes 页数：38 Pages

TI

德州仪器

具有 18 位通用总线收发器的 3.3V ABT 扫描测试设备

The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Sc • Members of the Texas InstrumentsSCOPETM Family of Testability Products• Members of the Texas InstrumentsWidebusTM Family• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)• Support Unregulated Battery Operation Down to 2.7 V• UBTT;

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德州仪器

丝印：LVTH18512；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：654.58 Kbytes 页数：39 Pages

TI

德州仪器

丝印：LVTH18512；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：655.55 Kbytes 页数：39 Pages

TI

德州仪器

丝印：LVTH18512；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：655.55 Kbytes 页数：39 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：562.71 Kbytes 页数：36 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：562.71 Kbytes 页数：36 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：703.08 Kbytes 页数：38 Pages

TI

德州仪器