3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

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TI

德州仪器

具有 20 位通用总线收发器的 3.3V ABT 扫描测试设备

The 'LVTH18504A and 'LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblie • Members of the Texas Instruments SCOPETM Family ofTestability Products• Members of the Texas Instruments WidebusTM Family• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode SignalOperation (5-V Input and Output Voltages With 3.3-VVCC)• Support Unregulated Battery Operation Down to 2.7 V• UBTTM;

TI

德州仪器

Package：64-LQFP；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN-TEST-DEV/XCVR 64-LQFP

TI

德州仪器

Package：64-LQFP；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 专用逻辑器件 描述：IC 20BIT SCAN TST DEV UBT 64LQFP

TI

德州仪器