丝印：LVTH18502A；Package：LQFP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Members of the Texas Instruments Widebus™ Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：803.41 Kbytes 页数：45 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Members of the Texas Instruments Widebus™ Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：803.41 Kbytes 页数：45 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Members of the Texas Instruments Widebus™ Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：801.66 Kbytes 页数：45 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

文件：784.85 Kbytes 页数：40 Pages

TI

德州仪器