3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes 页数：44 Pages

TI

德州仪器

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

文件：603.55 Kbytes 页数：41 Pages

TI

德州仪器

3.3V ABT 10 位可寻址扫描端口、多点可寻址 IEEE 标准 1149.1 (JTAG) TAP 收发器

The 'LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPETM devices, the ASP is not a b • Members of the Texas Instruments (TI TM) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture\n• Promote Reuse of Lower-Level (Chip/Board) Tests in System Environment\n• Switch-Based Architecture Allows Direct Connect of ;

TI

德州仪器

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes 页数：44 Pages

TI

德州仪器