SN74LVC1G98-EP中文资料增强型产品可配置多功能门数据手册TI规格书

特性 Features

• Controlled Baseline
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Qualification Pedigree
• Inputs Accept Voltages to 5.5 V
• Low Power Consumption, 10-µA Max ICC
• Ioff Supports Partial-Power-Down Mode Operation
• ESD Protection Exceeds JESD 22
• 200-V Machine Model (A115-A)
• 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.