SN74HCT165-Q1 Automotive 8-Bit Parallel-Load Shift Registers

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: • –40°C to +125°C, TA – Device HBM ESD Classification Level 2 – Device CDM ESD Classification Level C6 • LSTTL input logic compatible – VIL(max) = 0.8 V, VIH(min) = 2 V • CMOS input logic compatible

文件：883.22 Kbytes 页数：24 Pages

TI

德州仪器

SN74HCT165 8-Bit Parallel-Load Shift Registers

1 Features • LSTTL input logic compatible – VIL(max) = 0.8 V, VIH(min) = 2 V • CMOS input logic compatible – II ≤ 1 μA at VOL, VOH • 4.5 V to 5.5 V operation • Supports fanout up to 10 LSTTL loads • Direct overriding load (data) inputs • Gated clock inputs • Extended ambient temperature r

文件：881.62 Kbytes 页数：24 Pages

TI

德州仪器

SN74HCT165-Q1 Automotive 8-Bit Parallel-Load Shift Registers

文件：1.12002 Mbytes 页数：27 Pages

TI

德州仪器

SN74HCT165 8-Bit Parallel-Load Shift Registers

文件：1.11807 Mbytes 页数：27 Pages

TI

德州仪器

SN74HCT165 8-Bit Parallel-Load Shift Registers

文件：1.38725 Mbytes 页数：24 Pages

TI

德州仪器

SN74HCT165-Q1 Automotive 8-Bit Parallel-Load Shift Registers

文件：1.38867 Mbytes 页数：24 Pages

TI

德州仪器

具有 TLL 兼容输入的汽车类 8 位并行负载移位寄存器

The SN74HCT165-Q1 is a parallel- or serial-in, serial-out 8-bit shift register. Parallel-in access to each stage is provided by eight individual direct data (A-H) inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74HCT165-Q1 also features a clock-inhibit (CLK INH) functio • AEC-Q100 Qualified for automotive applications: \n• –40°C to +125°C, TA \n• Device HBM ESD Classification Level 2\n• LSTTL input logic compatible \n• CMOS input logic compatible \n• 4.5 V to 5.5 V operation\n• Direct Overriding Load (Data) Inputs\n• Gated Clock Inputs;

TI

德州仪器

SN74HCT165-Q1 Automotive 8-Bit Parallel-Load Shift Registers

文件：1.38867 Mbytes 页数：24 Pages

TI

德州仪器