SNx4AHCT32 Quadruple 2-Input Positive-OR Gates

1 Features • Inputs are TTL-voltage compatible • Latch-up performance exceeds 250 mA per JESD 17 • ESD protection exceeds JESD 22 – 2000-V Human-Body Model – 200-V Machine Model • On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other produc

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德州仪器

SN74AHCT32-Q1 Automotive Quadruple 2-Input Positive-OR Gate

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range of 4.5 V to 5.5 V • Low power consu

文件：1.53952 Mbytes 页数：26 Pages

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德州仪器

QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：199.87 Kbytes 页数：9 Pages

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QUADRUPLE 2-INPUT POSITIVE-OR GATE

文件：421.92 Kbytes 页数：8 Pages

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德州仪器

具有 TTL 兼容型 CMOS 输入的增强型产品 4 通道、2 输入、4.5V 至 5.5V 或门

The SN74AHCT32 is a quadruple 2-input positive-OR gate. This device performs the Boolean function Y = (A\\ • B\\)\\ or Y = A + B in positive logic. • Controlled Baseline \n• Extended Temperature Performance of –55°C to 125°C\n• Enhanced Product-Change Notification\n• EPIC™ (Enhanced-Performance Implanted CMOS) Process\n• Latch-Up Performance Exceeds 250 mA Per JESD 17\n• ESD Protection Exceeds 1000 V Per MIL-STD-833, Method 3015; Exceeds 200 V ;

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