SN74AHC74MDREP.A中文资料德州仪器数据手册PDF规格书

Controlled Baseline

– One Assembly/Test Site, One Fabrication

Site

Extended Temperature Performance of

–55°C to 125°C

Enhanced Diminishing Manufacturing

Sources (DMS) Support

Enhanced Product-Change Notification

Qualification Pedigree†

EPIC (Enhanced-Performance Implanted

CMOS) Process

Operating Range 2-V to 5.5-V VCC

Latch-Up Performance Exceeds 250 mA Per

JESD 17

ESD Protection Exceeds 2000 V Per

MIL-STD-883, Method 3015; Exceeds 200 V

Using Machine Model (C = 200 pF, R = 0)

description/ordering information

The SN74AHC74 dual positive-edge-triggered device is a D-type flip-flop.

A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the

other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time

requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs

at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval,

data at the D input can be changed without affecting the levels at the outputs.