SN74AHC1G02-EP中文资料增强型产品单路 2 输入、2V 至 5.5V 或非门数据手册TI规格书

描述 Description

This device contains a single 2-input NOR gate that performs the Boolean function Y = A • B or Y = A + B in positive logic.

特性 Features

• Controlled Baseline
• One Test Site
• Extended Temperature Performance of -55°C to 125°C
• Enhanced Product-Change Notification
• Operating Range of 2 V to 5.5 V
• Low Power Consumption, 10 µA Max ICC
• Schmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall Time
• 2000-V Human-Body Model (A114-A)
• 1000-V Charged-Device Model (C101)


Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.