SN74AHC164 8-Bit Parallel-Out Serial Shift Register

1 Features • Operating range 2V to 5.5V VCC • Low delay, 14ns maximum (VCC = 5V, CL = 50pF) • Latch-up performance exceeds 250mA per JESD 17 2 Applications • Increase the number of outputs on a microcontroller • Store up to 8 bits of data temporarily 3 Description The SN74AHC164 is a

文件：1.66708 Mbytes 页数：25 Pages

TI

德州仪器

SN74AHC164 8-Bit Parallel-Out Serial Shift Register

1 Features • Operating range 2V to 5.5V VCC • Low delay, 14ns maximum (VCC = 5V, CL = 50pF) • Latch-up performance exceeds 250mA per JESD 17 2 Applications • Increase the number of outputs on a microcontroller • Store up to 8 bits of data temporarily 3 Description The SN74AHC164 is a

文件：1.66791 Mbytes 页数：25 Pages

TI

德州仪器

SN74AHC164-Q1 Automotive 8-Bit Parallel-Out Serial Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 2V to 5.5V VCC • Low delay, 14ns max (VCC

文件：1.43691 Mbytes 页数：26 Pages

TI

德州仪器

SN74AHC164-Q1 Automotive 8-Bit Parallel-Out Serial Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 2V to 5.5V VCC • Low delay, 14ns max (VCC

文件：1.43691 Mbytes 页数：26 Pages

TI

德州仪器

丝印：AHC164Q；Package：TSSOP；SN74AHC164-Q1 Automotive 8-Bit Parallel-Out Serial Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 2V to 5.5V VCC • Low delay, 14ns max (VCC

文件：1.43605 Mbytes 页数：26 Pages

TI

德州仪器

丝印：AHC164Q；Package：TSSOP；SN74AHC164-Q1 Automotive 8-Bit Parallel-Out Serial Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 2V to 5.5V VCC • Low delay, 14ns max (VCC

文件：1.43691 Mbytes 页数：26 Pages

TI

德州仪器

丝印：AH164Q；Package：WQFN；SN74AHC164-Q1 Automotive 8-Bit Parallel-Out Serial Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 2V to 5.5V VCC • Low delay, 14ns max (VCC

文件：1.43691 Mbytes 页数：26 Pages

TI

德州仪器

汽车类 8 位串行输入和并行输出移位寄存器

SN74AHC164-Q1 是一个具有与门门控串行输入和异步清零 (CLR) 输入的 8 位移位寄存器。输出直接连接到内部移位寄存器，从而随着值移入寄存器，输出会立即发生变化。门控串行（A 和 B）输入允许完全控制输入数据；任一输入端的低电平抑制输入新数据，并在下一个时钟 (CLK) 脉冲将第一个触发器复位为低电平。高电平输入启用另一个输入，然后确定第一个触发器的状态。如果满足最短设置时间要求，则可以在 CLK 为高电平或低电平时更改串行输入上的数据。在 CLK 由低电平到高电平转换时会进行计时。 符合面向汽车应用的 AEC-Q100 标准： \n \n器件温度等级 1：-40°C 至 +125°C\n \n器件 HBM ESD 分类等级 2\n \n器件 CDM ESD 分类等级 C4B\n \n\n \n采用具有可湿性侧面的 QFN 封装\n \n工作范围为 2V 至 5.5V VCC\n \n低延迟，14ns max (VCC = 5V, CL = 50pF)\n \n闩锁性能超过 250mA，符合 JESD 17 规范;

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