SNx4AHC00 Quadruple 2-Input Positive-NAND Gates

1 Features • Operating Range 2-V to 5.5-V • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The ’AHC00 devices perform the Boolean function Y = A • B or Y = A + B in positive logic.

文件：2.73979 Mbytes 页数：37 Pages

TI

德州仪器

SN74AHC00-Q1 Automotive Quadruple 2-Input Positive-NAND Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V V CC • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The SN74AHC00 device performs the Boolean function Y + A • B or Y = A + B in positive logic.

文件：1.48223 Mbytes 页数：22 Pages

TI

德州仪器

QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree EPIC (Enhanced-Performance Implanted CMOS) Process O

文件：518.559 Kbytes 页数：15 Pages

TI

德州仪器

QUADRUPLE 2-INPUT POSITIVE-NAND GATES

文件：1.30573 Mbytes 页数：26 Pages

TI

德州仪器

QUADRUPLE 2-INPUT POSITIVE-NAND GATE

文件：236.61 Kbytes 页数：9 Pages

TI

德州仪器

汽车类 4 通道、2 输入、2V 至 5.5V 与非门

The SN74AHC00Q performs the Boolean function Y = A • B or Y = A + B in positive logic. • Qualified for Automotive Applications\n• Operating Range 2-V to 5.5-V VCC\n• Latch-Up Performance Exceeds 250 mA Per JESD 17\n• ESD Protection Exceeds JESD 22 \n• 2000-V Human-Body Model (A114-A)\n• 200-V Machine Model (A115-A)\n• 1000-V Charged-Device Model (C101);

TI

德州仪器

SN74AHC00-Q1 Automotive Quadruple 2-Input Positive-NAND Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V V CC • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description The SN74AHC00 device performs the Boolean function Y + A • B or Y = A + B in positive logic.

文件：1.48223 Mbytes 页数：22 Pages

TI

德州仪器