SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.76 Kbytes 页数：41 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：547.96 Kbytes 页数：35 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：763.01 Kbytes 页数：39 Pages

TI

德州仪器

丝印：ABTH182504A；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH182504A；Package：LQFP(PM)；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.76 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH182504A；Package：LQFP(PM)；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.76 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH182504A；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：547.96 Kbytes 页数：35 Pages

TI

德州仪器

具有 20 位通用总线收发器的扫描测试设备

The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assembl • Members of the Texas Instruments SCOPETM Family ofTestability Products• Members of the Texas Instruments WidebusTM Family• Compatible With the IEEE Standard 1149.1-1990 (JTAG) TestAccess Port and Boundary-Scan Architecture• UBT TM (Universal Bus Transceiver) Combines D-TypeLatches and D-Type Flip-;

TI

德州仪器