3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：829.29 Kbytes 页数：42 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：829.67 Kbytes 页数：42 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：606.01 Kbytes 页数：10 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：606.01 Kbytes 页数：10 Pages

TI

德州仪器