SN74AHCT126-Q1 Automotive Quadruple Bus Buffer Gate with 3-State Outputs

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range of 4.5 V to 5.5 V • ±8-mA output dr

文件：1.60308 Mbytes 页数：25 Pages

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德州仪器

SNx4AHCT126 Quadruple Bus Buffer Gates With 3-State Outputs

1 Features • Inputs are TTL-voltage compatible • Latch-up performance exceeds 250 mA per JESD 17 • ESD protection exceeds JESD 22: – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) • On products compliant to MIL-PRF-38535, All parameters are tested unless otherwise noted.

文件：1.90141 Mbytes 页数：31 Pages

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QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† ESD Protection Exceeds 2000 V Per MIL-STD-883, Metho

文件：517.82 Kbytes 页数：15 Pages

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QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件：756.69 Kbytes 页数：20 Pages

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德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件：745.94 Kbytes 页数：20 Pages

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QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件：556.83 Kbytes 页数：17 Pages

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QUADRUPLE BUS BUFFER GATES QUADRUPLE BUS BUFFER GATES

文件：376.26 Kbytes 页数：15 Pages

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具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 缓冲器

The SNxAHCT126 devices are quadruple-bus buffer gates featuring independent line drivers with 3-state outputs. • Inputs Are TTL-Voltage Compatible\n• Latch-Up Performance Exceeds 250 mA Per JESD 17\n• ESD Protection Exceeds JESD 22 \n• 2000-V Human-Body Model (A114-A)\n• 200-V Machine Model (A115-A)\n \n• On Products Compliant to MIL-PRF-38535, All Parameters Are Tested Unless Otherwise  Noted. On All Other ;

TI

德州仪器

SNx4AHCT126 Quadruple Bus Buffer Gates With 3-State Outputs

1 Features • Inputs are TTL-voltage compatible • Latch-up performance exceeds 250 mA per JESD 17 • ESD protection exceeds JESD 22: – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) • On products compliant to MIL-PRF-38535, All parameters are tested unless otherwise noted.

文件：1.90141 Mbytes 页数：31 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES QUADRUPLE BUS BUFFER GATES

文件：376.26 Kbytes 页数：15 Pages

TI

德州仪器