SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

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SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：559.74 Kbytes 页数：37 Pages

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SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：656.91 Kbytes 页数：41 Pages

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德州仪器

SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：656.91 Kbytes 页数：41 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：559.74 Kbytes 页数：37 Pages

TI

德州仪器

具有 18 位收发器和寄存器的扫描测试设备

The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ass ·Members of the Texas Instruments SCOPETM Family ofTestability Products·Members of the Texas Instruments WidebusTM Family·Compatible With the IEEE Standard 1149.1-1990 (JTAG) TestAccess Port and Boundary-Scan Architecture·Include D-Type Flip-Flops and Control Circuitry to ProvideMultiplexed Transmis;

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