SN54ABTH182646A中文资料德州仪器数据手册PDF规格书

Members of the Texas Instruments

SCOPE E Family of Testability Products

Members of the Texas Instruments

WidebusE Family

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Include D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

Bus Hold on Data Inputs Eliminates the

Need for External Pullup Resistors

B-Port Outputs of ’ABTH182646A Devices

Have Equivalent 25-W Series Resistors, So

No External Resistors Are Required

State-of-the-Art EPIC-IIB E BiCMOS Design

One Boundary-Scan Cell Per I/O

Architecture Improves Scan Efficiency

SCOPE E Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

– Even-Parity Opcodes

Packaged in 64-Pin Plastic Thin Quad Flat

(PM) Packages Using 0.5-mm

Center-to-Center Spacings and 68-Pin

Ceramic Quad Flat (HV) Packages Using

25-mil Center-to-Center Spacings