SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS

文件：537.39 Kbytes 页数：32 Pages

TI

德州仪器

具有八路总线收发器和寄存器的扫描测试设备

The ’ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acce • Members of the Texas Instruments SCOPE™ Family of Testability Products• Compatible With the IEEE Standard 1149.1–1990 (JTAG) Test Access Port and Boundary-Scan Architecture• Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode• SCOPE™ Instruction Set• IEEE Standard 1149.1-1990 ;

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS

文件：537.39 Kbytes 页数：32 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器