SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

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德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：665.11 Kbytes 页数：30 Pages

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德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：364.54 Kbytes 页数：25 Pages

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德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：483.36 Kbytes 页数：28 Pages

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德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：635.5 Kbytes 页数：30 Pages

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具有八路总线收发器的扫描测试设备

The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test ci • Members of the Texas Instruments SCOPETM Family of Testability Products \n• Functionally Equivalent to 'F245 and 'ABT245 in the Normal-Function Mode \n• IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ \n• Pseudo-Random Pattern Generation From Outputs \n• Binary C;

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：483.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：635.5 Kbytes 页数：30 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：665.11 Kbytes 页数：30 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：364.54 Kbytes 页数：25 Pages

TI

德州仪器