SN54ABT18502中文资料具有 18 位寄存总线收发器的扫描测试设备数据手册TI规格书

描述 Description

The SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas Instruments SCOPETM testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, this device is an 18-bit universal bus transceiver that combines D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceiver.
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the , LEBA, and CLKBA inputs.
In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Additional flexibility is provided in the test mode through the use of two boundary-scan cells (BSCs) for each I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
The SN54ABT18502 is characterized for operation over the full military temperature range of -55°C to 125°C.
 
 
 

特性 Features

• Member of the Texas Instruments SCOPETM Family ofTestability Products
• Member of the Texas Instruments WidebusTM Family
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) TestAccess Port and Boundary-Scan Architecture
• UBTTM (Universal Bus Transceiver) Combines D-TypeLatches and D-Type Flip-Flops for Operation in Transparent,Latched, or Clocked Mode
• Two Boundary-Scan Cells per I/O for Greater Flexibility
• State-of-the-Art EPIC-IIBTM BiCMOS DesignSignificantly Reduces Power Dissipation
• SCOPETM Instruction Set
• IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
• Parallel-Signature Analysis at Inputs With Masking Option
• Pseudo-Random Pattern Generation From Outputs
• Sample Inputs/Toggle Outputs
• Binary Count From Outputs
• Device Identification
• Even-Parity Opcodes
• Packaged in 68-Pin Ceramic Quad Flat Package Using 25-milCenter-to-Center SpacingsSCOPE, Widebus, UBT, and EPIC-IIB are trademarks ofTexas Instruments Incorporated.