SCAN92LV090SLCSLASHNOPB中文资料德州仪器数据手册PDF规格书

PDF无图
厂商型号

SCAN92LV090SLCSLASHNOPB

功能描述

SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN

丝印标识

SCAN92LV090SLC

封装外壳

NFBGA

文件大小

853.04 Kbytes

页面数量

22

生产厂商

TI

中文名称

德州仪器

网址

网址

数据手册

下载地址一下载地址二到原厂下载

更新时间

2025-11-30 20:00:00

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SCAN92LV090SLCSLASHNOPB规格书详情

1FEATURES

2• IEEE 1149.1 (JTAG) Compliant

• Bus LVDS Signaling

• Low Power CMOS Design

• High Signaling Rate Capability (Above 100

Mbps)

• 0.1V to 2.3V Common Mode Range for VID =

200mV

• ±100 mV Receiver Sensitivity

• Supports Open and Terminated Failsafe on

Port Pins

• 3.3V Operation

• Glitch Free Power Up/Down (Driver & Receiver

Disabled)

• Light Bus Loading (5 pF Typical) per Bus

LVDS Load

• Designed for Double Termination Applications

• Balanced Output Impedance

• Product Offered in 64 Pin LQFP Package and

NFBGA Package

• High Impedance Bus Pins on Power Off (VCC =

0V)

DESCRIPTION

The SCAN92LV090A is one in a series of Bus LVDS

transceivers designed specifically for the high speed,

low power proprietary backplane or cable interfaces.

The device operates from a single 3.3V power supply

and includes nine differential line drivers and nine

receivers. To minimize bus loading, the driver outputs

and receiver inputs are internally connected. The

separate I/O of the logic side allows for loop back

support. The device also features a flow through pin

out which allows easy PCB routing for short stubs

between its pins and the connector.

The driver translates 3V TTL levels (single-ended) to

differential Bus LVDS (BLVDS) output levels. This

allows for high speed operation, while consuming

minimal power with reduced EMI. In addition, the

differential signaling provides common mode noise

rejection of ±1V.

The receiver threshold is less than ±100 mV over a

±1V common mode range and translates the

differential Bus LVDS to standard (TTL/CMOS)

levels.

This device is compliant with IEEE 1149.1 Standard

Test Access Port and Boundary Scan Architecture

with the incorporation of the defined boundary-scan

test logic and test access port consisting of Test Data

Input (TDI), Test Data Out (TDO), Test Mode Select

(TMS), Test Clock (TCK), and the optional Test Reset

(TRST).

供应商 型号 品牌 批号 封装 库存 备注 价格
NS/国半
24+
NA/
1700
优势代理渠道,原装正品,可全系列订货开增值税票
询价
NS/国半
24+
LQFP64
880000
明嘉莱只做原装正品现货
询价
NSC
25+23+
LQFP64
7788
绝对原装正品全新进口深圳现货
询价
NS
22+
BGA
3000
原装正品,支持实单
询价
NS
24+
QFP64
3000
自己现货
询价
TI/德州仪器
23+
64-TQFP
3554
原装正品代理渠道价格优势
询价
NS/国半
24+
LQFP64
9600
原装现货,优势供应,支持实单!
询价
NS
18+
TQFP64
85600
保证进口原装可开17%增值税发票
询价
TI
三年内
1983
只做原装正品
询价
TI
16+
LQFP
10000
原装正品
询价