SCAN92LV090集成电路（IC）的驱动器接收器收发器规格书PDF中文资料

SCAN92LV090属于集成电路（IC）的驱动器接收器收发器。由德州仪器制造生产的SCAN92LV090驱动器，接收器，收发器该系列产品的主要功能是提供必需的硬件资源，以通过延长电缆或印制线进行通信。确切的功能会因所采用的通信协议而异，可能包括诸如瞬态抑制之类的功能，这些功能对于通信用途可能并非绝对必要，但对于可能的使用环境却是明智之选。

1FEATURES

2• IEEE 1149.1 (JTAG) Compliant

• Bus LVDS Signaling

• Low Power CMOS Design

• High Signaling Rate Capability (Above 100

Mbps)

• 0.1V to 2.3V Common Mode Range for VID =

200mV

• ±100 mV Receiver Sensitivity

• Supports Open and Terminated Failsafe on

Port Pins

• 3.3V Operation

• Glitch Free Power Up/Down (Driver & Receiver

Disabled)

• Light Bus Loading (5 pF Typical) per Bus

LVDS Load

• Designed for Double Termination Applications

• Balanced Output Impedance

• Product Offered in 64 Pin LQFP Package and

NFBGA Package

• High Impedance Bus Pins on Power Off (VCC =

0V)

DESCRIPTION

The SCAN92LV090A is one in a series of Bus LVDS

transceivers designed specifically for the high speed,

low power proprietary backplane or cable interfaces.

The device operates from a single 3.3V power supply

and includes nine differential line drivers and nine

receivers. To minimize bus loading, the driver outputs

and receiver inputs are internally connected. The

separate I/O of the logic side allows for loop back

support. The device also features a flow through pin

out which allows easy PCB routing for short stubs

between its pins and the connector.

The driver translates 3V TTL levels (single-ended) to

differential Bus LVDS (BLVDS) output levels. This

allows for high speed operation, while consuming

minimal power with reduced EMI. In addition, the

differential signaling provides common mode noise

rejection of ±1V.

The receiver threshold is less than ±100 mV over a

±1V common mode range and translates the

differential Bus LVDS to standard (TTL/CMOS)

levels.

This device is compliant with IEEE 1149.1 Standard

Test Access Port and Boundary Scan Architecture

with the incorporation of the defined boundary-scan

test logic and test access port consisting of Test Data

Input (TDI), Test Data Out (TDO), Test Mode Select

(TMS), Test Clock (TCK), and the optional Test Reset

(TRST).