General Description

The SCAN18245T is a high speed, low-power bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features

■ IEEE 1149.1 (JTAG) Compliant

■ Dual output enable control signals

■ 3-STATE outputs for bus-oriented applications

■ 9-bit data busses for parity applications

■ Reduced-swing outputs source 32 mA/sink 64 mA

■ Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V

■ TTL compatible inputs

■ 25 mil pitch SSOP (Shrink Small Outline Package)

■ Includes CLAMP and HIGHZ instructions

■ Member of Fairchild’s SCAN Products