SCAN182374ASSC中文资料仙童半导体数据手册PDF规格书

General Description

The SCAN182374A is a high performance BiCMOS D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

特性 Features

■ IEEE 1149.1 (JTAG) Compliant

■ High performance BiCMOS technology

■ 25Ω series resistor outputs eliminate need for external terminating resistors

■ Buffered positive edge-triggered clock

■ 3-STATE outputs for bus-oriented applications

■ 25 mil pitch SSOP (Shrink Small Outline Package)

■ Includes CLAMP, IDCODE and HIGHZ instructions

■ Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT

■ Power up 3-STATE for hot insert

■ Member of Fairchild’s SCAN Products