SCAN182373ASSC集成电路（IC）的锁存器规格书PDF中文资料

General Description

The SCAN182373A is a high performance BiCMOS transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture with the incorporation of the defined boundaryscan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features

■ IEEE 1149.1 (JTAG) Compliant

■ High performance BiCMOS technology

■ 25Ω series resistor outputs eliminate need for external terminating resistors

■ Buffered active-low latch enable

■ 3-STATE outputs for bus-oriented applications

■ 25 mil pitch SSOP (Shrink Small Outline Package)

■ Includes CLAMP, IDCODE and HIGHZ instructions

■ Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT

■ Power up 3-STATE for hot insert

■ Member of Fairchild’s SCAN Products