SA56004ADP数据手册恩XP中文资料规格书

描述 Description

The NXP Semiconductors SA56004X is an SMBus compatible, 11-bit remote/local digitaltemperature sensor with overtemperature alarms. The remote channel of the SA56004Xmonitors a diode junction, such as a substrate PNP of a microprocessor or a diodeconnected transistor such as the 2N3904 (NPN) or 2N3906 (PNP). With factory trimming,remote sensor accuracy of ±1 °C is achieved.
Undertemperature and overtemperature alert thresholds can be programmed to cause theALERT output to indicate when the on-chip or remote temperature is out of range. Thisoutput may be used as a system interrupt or SMBus alert. The T_CRIT output is activatedwhen the on-chip or remote temperature measurement rises above the programmedT_CRIT threshold register value. This output may be used to activate a cooling fan, senda warning or trigger a system shutdown. To further enhance system reliability, theSA56004X employs an SMBus time-out protocol. The SA56004X has a unique devicearchitecture.
The SA56004X is available in the SO8, TSSOP8 and HVSON8 packages. SA56004X has8 factory-programmed device address options. The SA56004X is pin-compatible with theLM86, MAX6657/8, and ADM1032.

特性 Features

Accurately senses temperature of remote microprocessor thermal diodes or diodeconnected transistors within ±1 °C
On-chip local temperature sensing within ±2 °C
Temperature range of −40 °C to +125 °C
11-bit, 0.125 °C resolution
8 different device addresses are available for server applications. The SA56004EDwith marking code 56004E, and SA56004EDP with marking code 6004E are addresscompatible with the National LM86, the MAX6657/8 and the ADM1032
Offset registers available for adjusting the remote temperature accuracy
Programmable under/overtemperature alarms: ALERT and T_CRIT
SMBus 2.0 compatible interface, supports TIMEOUT
Operating voltage range: 3.0 V to 3.6 V
I²C-bus Standard-mode and Fast-mode compatible
SO8, TSSOP8 and HVSON8 packages
Programmable conversion rate (0.0625 Hz to 26 Hz)
Undervoltage lockout prevents erroneous temperature readings
Latch-up testing is done to JEDEC Standard JESD78 which exceeds 100 mA

应用 Application

System thermal management in laptops, desktops, servers and workstations
Computers and office electronic equipment
Electronic test equipment and instrumentation
HVAC
Industrial controllers and embedded systems