Chip Nanostack Pulsed Laser Diode

Features: —Qualifications: The product qualification test plan is based on the guidelines of AEC-Q102, failure mechanism based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive applications. —ESD: 2 kV acc. to ANSI/ESDA/JEDEC JS-001 (HBM) —Reliable strained In

文件：592.09 Kbytes 页数：12 Pages

AMSCO

艾迈斯欧司朗

Industrial Automation (Machine Controls, Light Barriers, Vision Controls)

文件：592.95 Kbytes 页数：12 Pages

OSRAM

艾迈斯欧司朗