SN54SC1G125-SEP Radiation Tolerant, Single Bus Buffer Gate with 3-State Output

1 Features • VID TBD-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50 krad(Si) – TID performance assurance up to 30 krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) • Radiation - Single-Event Effects (SEE): – Single Event La

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德州仪器