N9201A中文资料PDF规格书
N9201A规格书详情
Introduction
The decreasing size of features on integrated circuits (45 nm and smaller) is driving the need for new parametric test capabilities. These capabilities must accommodate the advanced test structures developed for fast yield ramp up in process integration as well as process monitoring in semiconductor manufacturing.
High-throughput measurement of high volume parametric data is required to shorten the time for ramping up the process yield. This is accomplished by statistically analyzing and correcting the cause of wide range of process performance variations across a 300 mm wafer. Advanced test structures, addressable array test structures that contain address decoder circuitry, and a large number of test array elements with fewer probing pads and silicon area have been developed by major semiconductor manufacturers for this purpose.
产品属性
- 型号:
N9201A
- 制造商:
AGILENT
- 制造商全称:
AGILENT
- 功能描述:
Array Structure Parametric Test Option
供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
---|---|---|---|---|---|---|---|
N/A |
22+ |
QFN |
50000 |
只做原装正品,假一罚十,欢迎咨询 |
询价 | ||
ON |
2318+ |
原厂原包 |
6850 |
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询价 | ||
九芯电子 |
23+ |
SOP16 |
35000 |
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询价 | ||
2015 |
模块 |
300 |
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询价 | |||
- |
23+ |
连接器 |
10500 |
专业做连接器接插件原装进口公司现货 |
询价 | ||
ST |
23+ |
模块 |
160 |
全新原装正品,量大可订货!可开17%增值票!价格优势! |
询价 | ||
ST |
18+ |
SOT227 |
2050 |
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询价 | ||
N/A |
23+ |
QFP |
6500 |
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询价 | ||
N/A |
22+ |
QFN |
2500 |
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询价 | ||
ST |
23+ |
原厂原装 |
1100 |
全新原装现货 |
询价 |